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[IEEE 2008 26th International Conference on Microelectronics (MIEL 2008) - Nis, Serbia and Montenegro (2008.05.11-2008.05.14)] 2008 26th International Conference on Microelectronics - New boundary conditions for the study of charge transport in solid-state devices
Volovichev, I.N., Velazquez-Perez, J.E., Gurevich, Yu. G.Year:
2008
Language:
english
DOI:
10.1109/icmel.2008.4559245
File:
PDF, 180 KB
english, 2008