[IEEE 2008 IEEE Bipolar/BiCMOS Circuits and Technology...

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[IEEE 2008 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Monterey, CA (2008.10.13-2008.10.15)] 2008 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - Modeling of temperature dependent IC-VBE characteristics of SiGe HBTs from 43–400K

Ziyan Xu,, Xiaoyun Wei,, Guofu Niu,, Lan Luo,, Thomas, Dylan, Cressler, John D.
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Year:
2008
Language:
english
DOI:
10.1109/bipol.2008.4662717
File:
PDF, 675 KB
english, 2008
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