![](/img/cover-not-exists.png)
[IEEE 2008 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Monterey, CA (2008.10.13-2008.10.15)] 2008 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - Modeling of temperature dependent IC-VBE characteristics of SiGe HBTs from 43–400K
Ziyan Xu,, Xiaoyun Wei,, Guofu Niu,, Lan Luo,, Thomas, Dylan, Cressler, John D.Year:
2008
Language:
english
DOI:
10.1109/bipol.2008.4662717
File:
PDF, 675 KB
english, 2008