[IEEE 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012) - Singapore, Singapore (2012.07.2-2012.07.6)] 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - TID characterization of 0.13µm SONOS cell in 4Mb NOR flash memory
Qiao, Fengying, Yu, Xiao, Pan, Liyang, Ma, Haozhi, Wu, Dong, Xu, JunYear:
2012
Language:
english
DOI:
10.1109/ipfa.2012.6306287
File:
PDF, 404 KB
english, 2012