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[IEEE 2013 Symposium on Microelectronics Technology and Devices (SBMicro) - Curitiba, Brazil (2013.09.2-2013.09.6)] 28th Symposium on Microelectronics Technology and Devices (SBMicro 2013) - Alternative routes to minimize electrical degradation in 4H-SiC MOS capacitors
Stedile, Fernanda C., Pitthan, Eduardo, Palmieri, Rodrigo, Correa, Silma A., Soares, Gabriel V., Boudinov, HenriYear:
2013
Language:
english
DOI:
10.1109/sbmicro.2013.6676116
File:
PDF, 463 KB
english, 2013