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[IEEE Comput. Soc. Press IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems - Montreal, Que., Canada (17-19 Oct. 1994)] IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems - An approach to the development of a Iddq testable cell library

Ferrer, C., Mateo, D., Oliver, J., Rubio, A., Rullan, M.
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Year:
1994
Language:
english
DOI:
10.1109/dftvs.1994.630013
File:
PDF, 385 KB
english, 1994
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