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[IEEE 2012 Conference on Precision Electromagnetic Measurements (CPEM 2012) - Washington, DC, USA (2012.07.1-2012.07.6)] 2012 Conference on Precision electromagnetic Measurements - Investigated drift of the CT error and an aluminum shielding
Takahashi, Kunihiko, Yamawaki, Masao, Tadokoro, TakuyaYear:
2012
Language:
english
DOI:
10.1109/cpem.2012.6250707
File:
PDF, 345 KB
english, 2012