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[IEEE Comput. Soc. Press Fourth Asian Test Symposium - Bangalore, India (23-24 Nov. 1995)] Proceedings of the Fourth Asian Test Symposium - Fast functional testing of delay-insensitive circuits
Pagey, S.Year:
1995
Language:
english
DOI:
10.1109/ats.1995.485363
File:
PDF, 658 KB
english, 1995