[IEEE 2008 Second International Conference on Thermal Issues in Emerging Technologies (ThETA) - Cairo, Egypt (2008.12.17-2008.12.20)] 2008 Second International Conference on Thermal Issues in Emerging Technologies - Reliability evaluation on deterioration of power device using coupled electrical-thermal-mechanical analysis
Anzawa, Takashi, Yu, Qiang, Yamagiwa, Masanori, Shibutani, Tadahiro, Shiratori, MasakiYear:
2008
Language:
english
DOI:
10.1109/theta.2008.5167181
File:
PDF, 1.31 MB
english, 2008