[IEEE Comput. Soc. Press 8th International Conference on VLSI Design - New Delhi, India (4-7 Jan. 1995)] Proceedings of the 8th International Conference on VLSI Design - Testability-oriented channel routing
Khare, J., Mitra, S., Nag, P.K., Maly, U., Rutenbar, R.Year:
1995
Language:
english
DOI:
10.1109/icvd.1995.512110
File:
PDF, 745 KB
english, 1995