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[IEEE IEEE 14th Topical Meeting on Electrical Performance of Electronic Packaging, 2005. - Austin, TX, USA (Oct. 24-26, 2005)] IEEE 14th Topical Meeting on Electrical Performance of Electronic Packaging, 2005. - Channel timing error analysis for DDR2 memory systems

Oh, D., WooPoung Kim,, Stott, B., Ling Yang,, Yuan, C.
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Year:
2005
Language:
english
DOI:
10.1109/epep.2005.1563685
File:
PDF, 1.89 MB
english, 2005
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