[IEEE Comput. Soc Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings - Munich, Germany (9-12 March 1999)] Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078) - Full scan fault coverage with partial scan
Xijiang Lin,, Pomeranz, I., Reddy, S.M.Year:
1999
Language:
english
DOI:
10.1109/date.1999.761167
File:
PDF, 172 KB
english, 1999