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[IEEE 2009 25th Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (2009.03.15-2009.03.19)] 2009 25th Annual IEEE Semiconductor Thermal Measurement and Management Symposium - Stability analysis of refrigeration systems for electronics cooling
Zhang, Tiejun, Wen, John T., Catano, Juan, Zhou, Rongliang, Michna, Greg, Peles, Yoav, Jensen, Michael K.Year:
2009
Language:
english
DOI:
10.1109/stherm.2009.4810738
File:
PDF, 326 KB
english, 2009