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[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - A novel multi-point NBTI characterization methodology using Smart Intermediate Stress (SIS)
Schlunder, Christian, Hoffmann, Marcel, Vollertsen, Rolf-Peter, Schindler, Gunther, Heinrigs, Wolfgang, Gustin, Wolfgang, Reisinger, HansYear:
2008
Language:
english
DOI:
10.1109/relphy.2008.4558867
File:
PDF, 400 KB
english, 2008