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[IEEE Workshop Record 1992 IEEE Radiation Effects Data Workshop - New Orleans, LA, USA (14 July 1992)] Workshop Record 1992 IEEE Radiation Effects Data Workshop - SEU tests of a 80386 based flight-computer/data-handling system and of discrete PROM and EEPROM devices, and SEL tests of discrete 80386, 80387, PROM, EEPROM and ASICs
LaBel, K., Stassinopoulos, E.G., Brucker, G.J., Stauffer, C.A.Year:
1992
Language:
english
DOI:
10.1109/redw.1992.247332
File:
PDF, 909 KB
english, 1992