Fuzzy-based risk priority number in FMEA for semiconductor...

International Journal of Production Research 2014 / 01 Vol. 52; Iss. 2

Fuzzy-based risk priority number in FMEA for semiconductor wafer processes

Yeh, Tsu-Ming, Chen, Long-Yi
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Volume:
52
Language:
english
Journal:
International Journal of Production Research
DOI:
10.1080/00207543.2013.837984
Date:
January, 2014
File:
PDF, 229 KB
english, 2014
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