[IEEE 2010 IEEE 22nd International Semiconductor Laser...

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[IEEE 2010 IEEE 22nd International Semiconductor Laser Conference (ISLC) - Kyoto, Japan (2010.09.26-2010.09.30)] 22nd IEEE International Semiconductor Laser Conference - Measurement of internal quantum efficiency and temperature dependence of gain and loss in interband cascade lasers near room-temperature

Chryssis, Athanasios, Ryu, Geunmin, Dagenais, Mario
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Year:
2010
Language:
english
DOI:
10.1109/islc.2010.5642762
File:
PDF, 114 KB
english, 2010
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