[IEEE 2009 IEEE International Symposium on Electromagnetic...

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[IEEE 2009 IEEE International Symposium on Electromagnetic Compatibility - EMC 2009 - Austin, TX, USA (2009.08.17-2009.08.21)] 2009 IEEE International Symposium on Electromagnetic Compatibility - Predicting noise voltage from trace crossing split planes on printed circuit boards

Pan, Weifeng, Connor, Samuel, Archambeault, Bruce
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Year:
2009
Language:
english
DOI:
10.1109/isemc.2009.5284660
File:
PDF, 250 KB
english, 2009
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