[IEEE 2009 IEEE International Symposium on Electromagnetic Compatibility - EMC 2009 - Austin, TX, USA (2009.08.17-2009.08.21)] 2009 IEEE International Symposium on Electromagnetic Compatibility - Predicting noise voltage from trace crossing split planes on printed circuit boards
Pan, Weifeng, Connor, Samuel, Archambeault, BruceYear:
2009
Language:
english
DOI:
10.1109/isemc.2009.5284660
File:
PDF, 250 KB
english, 2009