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[IEEE 2008 IEEE International Integrated Reliability Workshop Final Report (IRW) - South lake Tahoe, CA, USA (2008.10.12-2008.10.16)] 2008 IEEE International Integrated Reliability Workshop Final Report - Geometry effects on the NBTI degradation of PMOS transistors
Math, Gaetan, Benard, Christelle, Ogier, Jean-Luc, Goguenheim, DidierYear:
2008
Language:
english
DOI:
10.1109/irws.2008.4796087
File:
PDF, 1.12 MB
english, 2008