[IEEE 2008 19th EAEEIE Annual Conference - Tallinn (2008.06.29-2008.07.2)] 2008 19th EAEEIE Annual Conference - Teaching digital test with BIST analyzer
Jutman, A., Tsertov, A., Tsepurov, A., Aleksejev, I., Ubar, R., Wuttke, H.-D.Year:
2008
Language:
english
DOI:
10.1109/eaeeie.2008.4610171
File:
PDF, 406 KB
english, 2008