![](/img/cover-not-exists.png)
[IEEE First International Symposium on Empirical Software Engineering and Measurement (ESEM 2007) - Madrid, Spain (2007.09.20-2007.09.21)] First International Symposium on Empirical Software Engineering and Measurement (ESEM 2007) - Relevant Information Sources for Successful Technology Transfer: A Survey Using Inspections as an Example
Jedlitschka, Andreas, Ciolkowski, Marcus, Denger, Christian, Freimut, Bernd, Schlichting, AndreasYear:
2007
Language:
english
DOI:
10.1109/esem.2007.60
File:
PDF, 333 KB
english, 2007