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[IEEE First International Symposium on Empirical Software Engineering and Measurement (ESEM 2007) - Madrid, Spain (2007.09.20-2007.09.21)] First International Symposium on Empirical Software Engineering and Measurement (ESEM 2007) - Relevant Information Sources for Successful Technology Transfer: A Survey Using Inspections as an Example

Jedlitschka, Andreas, Ciolkowski, Marcus, Denger, Christian, Freimut, Bernd, Schlichting, Andreas
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Year:
2007
Language:
english
DOI:
10.1109/esem.2007.60
File:
PDF, 333 KB
english, 2007
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