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Quantitative Characterization of the Liquid Crystal Doped With Nanoscaled Tin-Doped Indium Oxide Under High Electric Fields
Liang, Bau-Jy, Liu, Don-Gey, Tsai, Wei-Lung, Hsu, Pei-Fung, Jin, Bing-Jie, Hsiau, Min-Lung, Louh, Rong-FuhVolume:
14
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2013.2286811
Date:
March, 2014
File:
PDF, 969 KB
english, 2014