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[IEEE 2007 IEEE Custom Integrated Circuits Conference - San Jose, CA, USA (2007.09.16-2007.09.19)] 2007 IEEE Custom Integrated Circuits Conference - Multi-Bit Sigma Delta ADC with Reduced Feedback Levels, Extended Dynamic Range and Increased Tolerance for Analog Imperfections
Wu, Jian-Yi, Subramoniam, Raj, Zhang, Zhenyong, Djabbari, Ali, Holloway, Peter, Maloberti, Franco, Yousefi, Masood, Aslan, Mehmet, Hong, Hua, Bahai, AhmadYear:
2007
Language:
english
DOI:
10.1109/cicc.2007.4405685
File:
PDF, 3.12 MB
english, 2007