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[IEEE 2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) - Austin, TX, USA (2012.06.3-2012.06.8)] 2012 38th IEEE Photovoltaic Specialists Conference - Raman measurements on GaN thin films for PV - purposes
Contreras-Puente, G., Cantarero, A., Recio, J. M., de Melo, O., Hernandez-Cruz, E., de Moure Flores, F., Mendoza-Perez, R., Santana-Rodriguez, G., Aguilar-Hernandez, J., Lopez-Lopez, M., Zamora, L., EYear:
2012
Language:
english
DOI:
10.1109/pvsc.2012.6317563
File:
PDF, 474 KB
english, 2012