An Area Efficient Early ${Z}$-Test Method for 3-D Graphics...

IEEE Transactions on Circuits and Systems I: Regular Papers 2008 / 08 Vol. 55; Iss. 7

An Area Efficient Early ${Z}$-Test Method for 3-D Graphics Rendering Hardware

Chang-Hyo Yu,, Donghyun Kim,, Lee-Sup Kim,
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Volume:
55
Language:
english
Journal:
IEEE Transactions on Circuits and Systems I: Regular Papers
DOI:
10.1109/tcsi.2008.918078
Date:
August, 2008
File:
PDF, 1.59 MB
english, 2008
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