Combined in situ atomic force microscopy and infrared...

Combined in situ atomic force microscopy and infrared attenuated total reflection spectroelectrochemistry

Neubauer, Daniel, Scharpf, Jochen, Pasquarelli, Alberto, Mizaikoff, Boris, Kranz, Christine
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
138
Year:
2013
Language:
english
Journal:
The Analyst
DOI:
10.1039/c3an01169k
File:
PDF, 860 KB
english, 2013
Conversion to is in progress
Conversion to is failed