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Combined in situ atomic force microscopy and infrared attenuated total reflection spectroelectrochemistry
Neubauer, Daniel, Scharpf, Jochen, Pasquarelli, Alberto, Mizaikoff, Boris, Kranz, ChristineVolume:
138
Year:
2013
Language:
english
Journal:
The Analyst
DOI:
10.1039/c3an01169k
File:
PDF, 860 KB
english, 2013