[IEEE 2007 IEEE International Integrated Reliability Workshop Final Report - South Lake Tahoe, CA, USA (2007.10.15-2007.10.18)] 2007 IEEE International Integrated Reliability Workshop Final Report - Investigation of NBTI recovery induced by conventional measurements for pMOSFETs with ultra-thin SiON gate dielectrics
Lei Jin,, Mingzhen Xu,Year:
2007
Language:
english
DOI:
10.1109/irws.2007.4469218
File:
PDF, 732 KB
english, 2007