IEEE Transactions on Components Packaging and Manufacturing Technology Part A
1997 / Dec. Vol. 20; Iss. 4
The world of thermal characterization according to DELPHI-Part I: Background to DELPHI
Rosten, H.I., Lasance, C.J.M., Parry, J.D.Volume:
20
Language:
english
Journal:
IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A
DOI:
10.1109/95.650927
Date:
January, 1997
File:
PDF, 103 KB
english, 1997