A 64K FET Dynamic Random Access Memory: Design Considerations and Description
Lo, T. C., Scheuerlein, R. E., Tamlyn, R.Volume:
24
Language:
english
Journal:
IBM Journal of Research and Development
DOI:
10.1147/rd.243.0318
Date:
May, 1980
File:
PDF, 702 KB
english, 1980