[IEEE 2007 IEEE International Test Conference - Santa...

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[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - Embedded multi-detect ATPG and Its Effect on the Detection of Unmodeled Defects

Geuzebroek, Jeroen, Marinissen, Erik Jan, Majhi, Ananta, Glowatz, Andreas, Hapke, Friedrich
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Year:
2007
Language:
english
DOI:
10.1109/test.2007.4437649
File:
PDF, 184 KB
english, 2007
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