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[IEEE 2010 IEEE International Conference on Automation Science and Engineering (CASE 2010) - Toronto, ON (2010.08.21-2010.08.24)] 2010 IEEE International Conference on Automation Science and Engineering - Durability studies of PBI-based membrane elect rode assemblies for high temperature PEMFCs
Krishnan, Lakshmi, Snelson, Todd, Puffer, Ray, Walczyk, DanielYear:
2010
Language:
english
DOI:
10.1109/coase.2010.5584497
File:
PDF, 715 KB
english, 2010