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High-$V_{\rm GS}$ PFET DC Hot-Carrier Mechanism and Its Relation to AC Degradation
Rauch, S.E., Guarin, F., La Rosa, G.Volume:
10
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2009.2032298
Date:
March, 2010
File:
PDF, 798 KB
english, 2010