[IEEE Comput. Soc. Press Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) - Monterey, CA, USA (27 April-1 May 1997)] Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) - Critical hazard free test generation for asynchronous circuits
Khoche, A., Brunvand, E.Year:
1997
Language:
english
DOI:
10.1109/vtest.1997.600270
File:
PDF, 557 KB
english, 1997