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[IEEE 2006 IEEE Instrumentation and Measurement Technology - Sorrento, Italy (2006.04.24-2006.04.27)] 2006 IEEE Instrumentation and Measurement Technology Conference Proceedings - High-level Accurate Model of High-resolution Pipelined ADC's
Azzolini, C., Vecchi, D., Boni, A., Chiorboli, G.Year:
2006
Language:
english
DOI:
10.1109/imtc.2006.328411
File:
PDF, 266 KB
english, 2006