![](/img/cover-not-exists.png)
[IEEE 2007 International Workshop on Physics of Semiconductor Devices - Mumbai, India (2007.12.16-2007.12.20)] 2007 International Workshop on Physics of Semiconductor Devices - A 2-D analytical subthreshold model for gate misalignment effects on graded channel DG FD SOI n-MOSFET
Sharma, Rupendra Kumar, Saxena, Manoj, Gupta, Mridula, Gupta, R. S.Year:
2007
Language:
english
DOI:
10.1109/iwpsd.2007.4472482
File:
PDF, 111 KB
english, 2007