![](/img/cover-not-exists.png)
[IEEE Comput. Soc. Press the European Design and Test Conference. ED&TC 1995 - Paris, France (6-9 March 1995)] Proceedings the European Design and Test Conference. ED&TC 1995 - Imperfect linear duplication of combinational circuits
Latypov, R.Kh., Stolov, Y.L.Year:
1995
Language:
english
DOI:
10.1109/edtc.1995.470326
File:
PDF, 107 KB
english, 1995