[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Time-critical computing on a single-chip massively parallel processor
Dinechin, Benoit Dupont de, Amstel, Duco van, Poulhies, Marc, Lager, GuillaumeYear:
2014
Language:
english
DOI:
10.7873/date.2014.110
File:
PDF, 506 KB
english, 2014