[IEEE 2008 IEEE Custom Integrated Circuits Conference - CICC 2008 - San Jose, CA, USA (2008.09.21-2008.09.24)] 2008 IEEE Custom Integrated Circuits Conference - Mismatch analysis and statistical design at 65 nm and below
Pileggi, Larry, Keskin, Gokce, Li, Xin, Ken Mai,, Proesel, JonYear:
2008
Language:
english
DOI:
10.1109/cicc.2008.4672006
File:
PDF, 289 KB
english, 2008