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[IEEE 2000 IEEE Radiation Effects Data Workshop. Workshop Record - Reno, NV, USA (24-28 July 2000)] 2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527) - Co-60 total dose test of 14- and 16-bit ADCs
Tomasch, G., Harboe-Sorensen, R., Muller, R., Tzscheetzsch, T.Year:
2000
Language:
english
DOI:
10.1109/redw.2000.896265
File:
PDF, 440 KB
english, 2000