![](/img/cover-not-exists.png)
[IEEE 58th ARFTG Conference Digest - San Diego, CA, USA (2001.11.29-2001.11.30)] 58th ARFTG Conference Digest - Measurement of Memory Effect of High-Power Si LDMOSFET Amplifier Using Two-tone Phase Evaluation
Kim, Bumman, Yang, Youngoo, Cha, Jeonghyeon, Woo, Young Yun, Yi, JaehyokYear:
2001
Language:
english
DOI:
10.1109/arftg.2001.327497
File:
PDF, 322 KB
english, 2001