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[IEEE 2009 Proceedings of the European Solid State Device Research Conference (ESSDERC) - Athens, Greece (2009.09.14-2009.09.18)] 2009 Proceedings of the European Solid State Device Research Conference - An accurate approach for statistical estimation of leakage current considering multi-parameter process variations in nanometer CMOS technologies
D'Agostino, Carmelo, Le Coz, Julien, Flatresse, Philippe, Beigne, Edith, Belleville, MarcYear:
2009
Language:
english
DOI:
10.1109/essderc.2009.5331488
File:
PDF, 988 KB
english, 2009