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[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Generation of traps in AlGaN/GaN HEMTs during RF-and DC-stress test
Caesar, M., Dammann, M., Polyakov, V., Waltereit, P., Bronner, W., Baeumler, M., Quay, R., Mikulla, M., Ambacher, O.Year:
2012
Language:
english
DOI:
10.1109/irps.2012.6241883
File:
PDF, 1.28 MB
english, 2012