Spatially resolved characterization of the microwave...

Spatially resolved characterization of the microwave properties of superconducting thin films by low temperature microwave scanning near-field microscopy

Feng, Y.J., Wu, L.Y., Wang, K.L., Jiang, T., Kang, L., Yang, S.Z., Wu, P.H.
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Volume:
13
Language:
english
Journal:
IEEE Transactions on Appiled Superconductivity
DOI:
10.1109/tasc.2003.812041
Date:
June, 2003
File:
PDF, 286 KB
english, 2003
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