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[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - Test Data Compression of 100x for Scan-Based BIST
Arai, Masayuki, Fukumoto, Satoshi, Iwasaki, Kazuhiko, Matsuo, Tatsuru, Hiraide, Takahisa, Konishi, Hideaki, Emori, Michiaki, Aikyo, TakashiYear:
2006
Language:
english
DOI:
10.1109/test.2006.297664
File:
PDF, 9.84 MB
english, 2006