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[IEEE 2007 International Symposium on Industrial Embedded Systems - Costa da Caparica, Portugal (2007.07.4-2007.07.6)] 2007 International Symposium on Industrial Embedded Systems - Optimization of Memory-Constrained Hybrid BIST for Testing Core-Based Systems
Jervan, Gert, Kruus, Helena, Orasson, Elmet, Ubar, RaimundYear:
2007
Language:
english
DOI:
10.1109/sies.2007.4297319
File:
PDF, 4.22 MB
english, 2007