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[IEEE 2006 IEEE/ACM International Conference on Computer Aided Design - Double Tree Hotel, San Jose, CA,USA (2006.11.5-2006.11.9)] 2006 IEEE/ACM International Conference on Computer Aided Design - Exploring Linear Structures of Critical Path Delay Faults to Reduce Test Efforts
Lu, Shun-yen, Hsieh, Pei-ying, Liou, Jing-jiaYear:
2006
Language:
english
DOI:
10.1109/iccad.2006.320072
File:
PDF, 7.44 MB
english, 2006