[IEEE Electrical Performance of Electronic Packaging - San Jose, CA, USA (27-29 Oct. 1997)] Electrical Performance of Electronic Packaging - A simultaneous switching noise analysis of a high speed memory module including the test environments and system-level models
Joon-Ho Choi,, Kyung-Hwa Kim,, Jung-Bae Lee,, Taek-Soo Kim,, Jeong-Taek Kong,, Sang-Hoon Lee,Year:
1997
Language:
english
DOI:
10.1109/epep.1997.634050
File:
PDF, 402 KB
english, 1997