[IEEE 2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems - Liberec, Czech Republic (2009.04.15-2009.04.17)] 2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems - Measurement of power supply noise tolerance of self-timed processor
Asada, Kunihiro, Sogabe, Taku, Nakura, Toru, Ikeda, MakotoYear:
2009
Language:
english
DOI:
10.1109/ddecs.2009.5012112
File:
PDF, 374 KB
english, 2009