[IEEE 2005 12th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2005) - Gammarth (2005.12.11-2005.12.14)] 2005 12th IEEE International Conference on Electronics, Circuits and Systems - Power aware test-data compression for scan-based testing
Gekas, G., Nikolos, D., Kalligeros, E., Kavousianos, X.Year:
2005
Language:
english
DOI:
10.1109/icecs.2005.4633432
File:
PDF, 944 KB
english, 2005