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[IEEE 2008 IEEE International Conference on Systems, Man and Cybernetics (SMC) - Singapore, Singapore (2008.10.12-2008.10.15)] 2008 IEEE International Conference on Systems, Man and Cybernetics - Automatic identification and removal of artifacts in EEG using a probabilistic multi-class SVM approach with error correction
Shao, Shi-Yun, Shen, Kai-Quan, Ong, Chong-Jin, Li, Xiao-Ping, Wilder-Smith, Einar P. V.Year:
2008
Language:
english
DOI:
10.1109/icsmc.2008.4811434
File:
PDF, 406 KB
english, 2008