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[IEEE 2007 IEEE International Workshop on Memory Technology, Design and Testing (MTDT) - Taipei, Taiwan (2007.12.3-2007.12.5)] 2007 IEEE International Workshop on Memory Technology, Design and Testing - An ALU cluster intellectual property for magnetic RAM media applications platform
Chia-Yi Liou,, Herming Chiueh,Year:
2007
Language:
english
DOI:
10.1109/mtdt.2007.4547622
File:
PDF, 391 KB
english, 2007